Semiconductor Material and Device Characterization Second Edition
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More About This Title Semiconductor Material and Device Characterization Second Edition
English
DIETER K. SCHRODER is Professor in the Department of Electrical Engineering at Arizona State University. A recipient of the ASU College of Engineering Teaching Excellence Award, he is author of Advanced MOS Devices.
English
Resistivity.
Carrier and Doping Density.
Contact Resistance, Schottky Barriers, and Electromigration.
Series Resistance, Channel Length and Width, Threshold Voltage, and Hot Carriers.
Defects.
Oxide and Interface Trapped Charges, Oxide Integrity.
Carrier Lifetime.
Mobility.
Optical Characterization.
Chemical and Physical Characterization.
Appendices.
Index.
Carrier and Doping Density.
Contact Resistance, Schottky Barriers, and Electromigration.
Series Resistance, Channel Length and Width, Threshold Voltage, and Hot Carriers.
Defects.
Oxide and Interface Trapped Charges, Oxide Integrity.
Carrier Lifetime.
Mobility.
Optical Characterization.
Chemical and Physical Characterization.
Appendices.
Index.
