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- Wiley
More About This Title Statistical Methods for Survival Data Analysis, Third Edition
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English
JOHN WENYU WANG, PhD, is an Associate Professor of Biostatistics at the University of Oklahoma Health Sciences Center. He received a master’s degree from the Academy of Sciences of China and his doctorate from the University of Maryland.
- English
English
Introduction.
Functions of Survival Time.
Examples of Survival Data Analysis.
Nonparametric Methods of Estimating Survival Functions.
Nonparametric Methods for Comparing Survival Distributions.
Some Well-Known Parametric Survival Distributions and Their Applications.
Estimation Procedures for Parametric Survival Distributions Without Covariates.
Graphical Methods in Survival Distribution Fitting.
Tests of Goodness of Fit and Distribution Selection.
Parametric Methods for Comparing Two Survival Distributions.
Parametric Methods for Regression Model Fitting and Identification of Prognostic Factors.
Identification of Prognostic Factors Related to Survival Time: Cox Proportional Hazards Model.
Identification of Prognostic Factors Related to Survival Time: Nonproportional Hazards Models.
Identification of Risk Factors Related to Dichotomous and Polychotomous Outcomes.
Appendix A: Newton-Raphson Method.
Appendix B: Statistical Tables.
References.
Index.
- English
English
"The book is well written and provides explicit details of the models and methods used." (Journal of the American Statistical Association, June 2004)
"…contains thorough descriptions and illustrations of several useful nonparametric and parametric statistical methods to analyze survival data." (Journal of Statistical Computation & Simulation, May 2004)
"...a comprehensive and clearly written textbook...a very good reference..." (Short Book Reviews, Vol 24(1), 2004)
"...continues to be application-oriented with a minimum level of mathematics..." (Zentralblatt Math, Vol 1026, 2004)
"This third edition is a significant upgrade...this remains an excellent choice or a basic textbook in survival analysis..." (Technometrics, Vol. 45, No. 4, November 2003)
