Total-Reflection X-Ray Fluorescence Analysis
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More About This Title Total-Reflection X-Ray Fluorescence Analysis
English
REINHOLD KLOCKENKÄMPER heads the Physical Analysis Research Group at the Institut für Spektro-chemie und angewandte Spektro-skopie and is Associate Lecturer at the Fachhochschule in Dortmund, Germany. His experience in X-ray spectral analysis spans three decades, and he has published over 80 papers, reviews, and book articles. Professor Klockenkämper's research interests include micro-distribution and surface-layer analysis in general, and micro- and trace analysis by total-reflection X-ray fluorescence in particular.
English
Fundamentals of X-Ray Fluorescence.
Principles of Total-Reflection XRF.
Instrumentation for TXRF.
Performance of TXRF Analyses.
Efficiency and Applicability of TXRF.
Evaluation and Prospects.
Index.
Principles of Total-Reflection XRF.
Instrumentation for TXRF.
Performance of TXRF Analyses.
Efficiency and Applicability of TXRF.
Evaluation and Prospects.
Index.
